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SEMPA (Scanning Electron Microscope with Polarization Analysis)

 

 

The SEMPA can be used to get magnetic domain images (vector images) under external magnetic field up to 3000 Oe in temperature range from 100 K-450K. The SEMPA system is equipped with full surface science characterizations, including sample cleaning (heating, sputtering), LEED, MEED, Auger spectroscopy, Auger imaging and multiple growth sources. An in-situ MOKE can be used for global magnetic property characterization. A load lock chamber with UHV suitcase is attached to the system for sample transferring.

   
   

 Oak Ridge National Laboratory