| This high-flux beamline instrument is designed to permit the measurement of precise lattice parameters.
Features:
- Six-circle Huber diffractometer with split chi-ring; crystal analyzers (Si, Ge, LiF, graphite); CAMAC multichannel analyzer; pinholes > 10 mm diam; scintillation and proportional counters
- Focusing incident beam silicon monochromator
- Tunable wavelengths from 0.5 to 2.5 Å
- Buehler HDK 2.3 furnace with Pt, W, Ta, or Mo strip heaters (RT to 1600°C , or 2200°C+ in vacuum) Controlled environment (O2, Ar, N2, H2, ambient, etc.), 1 atm
- Rotating capillary mount and optional furnace
Applications:
- Oxidation/reduction kinetics
- Phase equilibria studies
- Order/disorder transformations
- Single-crystal diffraction
- Rietveld analysis
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