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X-ray diffraction permits measurement of texture and either biaxial or triaxial residual strains in ceramic and metal alloy surfaces. These instruments are designed to permit mapping of the residual stress state across the surface of a specimen and as a function of deptwith electropolishing.
Common Features:
- Scintag PTS four-axis goniometer for stress and texture analysis with unrestricted 2θ range (from –2 to +162°)
- Highly automated, flexible data-collection options (Ψ tilt or Ω tilt and multiple pole figure
- Solid-state detection of x-rays yields high peak-to-background ratios and excellent sensitivity
- Specimen dimensions up to 140 mm in diameter, 40 mm in thickness, and 5 kg in mass
- Software includes biaxial and triaxial stress analysis, pole figures, and orientation distribution function calculations from texture data
- Load frames for determination of diffraction elastic constants and hot
- Grazing incidence x-ray diffraction for depth profiling of stress and phases
- Parallel-beam optics for characterization of curved or irregular surfaces
Cu Rotating Anode:
- High-flux, high-brilliance rotating anode source
- Copper target
- Incident parabolic mirror and radial-divergence-limiting slits for true parallel beam optics
Tube Source:
- Interchangeable 2-kW x-ray tubes
- Divergent-beam and near-parallel-beam optics
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