Jane Howe operating the HF-3300 field-emission TEM/STEM basic instrument

• Cold field-emission electron source
• 0.19-nm point resolution in TEM; 0.2-nm in STEM
• Sub-nanometer spatial resolution for x-ray elemental analysis
• 2 Möllenstedt biprisms for advanced electron holography capabilities
• Energy-dispersive spectroscopy
• All-digital image acquisition and microscope remote control
• Available for remote microscopy