View of the ACEM from the control room, showing monitors used for instrument control and aberration corrector operation.

The MAUC has installed the JEOL 2200FS-AC aberration-corrected STEM/TEM instrument (the “ACEM”) in the new Advanced Microscopy Laboratory, located adjacent to the HTML. The instrument provides a nominal probe diameter of 0.7Å, with simultaneous annular dark-field and bright-field imaging in STEM mode. An in-column energy filter allows chemical species and bonding information to be obtained from single atomic columns. An information limit for TEM of 0.9Å has also been demonstrated.

Techniques/Capabilities:

• Aberration-corrected electron probe <100pm high angle annular dark field (HAADF) imaging
• Simultaneous BF/DF-STEM
• Atomic column resolution EELS
• STEM EELS spectrum imaging
• EFTEM spectrum imaging
• Remote access/operation

Current Research Activities:

• Bimetallic catalyst characterization
• Ex-situ studies of catalyst nanostructure evolution
• High resolution Z-contrast imaging of complex oxides

Contact: Larry Allard, allardlfjr@ornl.gov, (865) 574-4981