MAUC Instruments

	HF-3300 field-emission TEM/STEM basic instrument

Field-emission transmission electron microscopy (FE-TEM) and aberration-corrected scanning transmission electron microscopy (STEM) instruments allow imaging and chemical microanalysis to the atomic level. The latest generation aberration-corrected electron microscope provides sub-Ångström imaging capability, e.g., for imaging single atoms in catalytic materials. Surface analysis is provided by a field-emission scanning Auger nanoprobe. The electron microprobe allows quantitative chemical analysis of bulk microstructures at the sub-micron level. An environmental SEM allows characterization of surface morphology and chemistry. The most modern specimen preparation techniques are available, utilizing instruments such as a focused-ion-beam miller with microsampling capability; a cryo-ultramicrotome; other ion-milling instruments; and assorted slicing, grinding, and polishing devices.