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Hitachi FB-5000 dual-beam focused ion beam (FIB) miller allows in-situ microsampling for TEM specimen preparation and milling for micro- machining at the submicron level. MAUC staff member D. Coffey at the controls. |
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The MAUC offers a number of special capabilities, such as dual-biprism electron holography in the HF-3300 TEM, which allow the image phase information to be obtained from thin sample regions. This permits determination of the shapes of nanotube cross sections, the profile of dopants in p/n junctions, and the shape of electric and magnetic fields surrounding particles and structures. The Hitachi FB-5000 dual-beam FIB instrument also provides high-resolution SEM imaging, EDS for elemental analysis, and a backscattered electron detector for orientation imaging. Digital imaging on all instruments provides the apability to access instruments for remote microscopy research sessions. |
