Xenon Flash Thermal Diffusivity System

  TPUC

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  Diffraction User Center
  Residual Stress User Center
  Diff. and Therm. Prop. Group
  High Temperature Materials Laboratory
  Metals and Ceramics Division
  Oak Ridge National Laboratory


Reliable measurement of thermal diffusivity in many cases can be obtained through the flash technique. In this method, a short pulse (less than 1 millisecond) of heat is applied to the front face of a specimen using a xenon flash lamp, and the temperature change of the rear face is measured with an InSb infrared (IR) detector. The xenon flash thermal diffusivity system is optimized for room-temperature measurements.

Features:

  • Optimized for room-temperature thermal diffusivity measurements of ceramics, metals, composites, and coatings
  • Rapid numerical data analysis of temperature rise vs. time
  • Finite pulse-width and heat-loss corrections
  • Accepts a wide range of specimen sizes and shapes
  • Complete computer control of operations

Applications:

The xenon flash thermal diffusivity system has been used in the study of factors affecting the properties of materials, such as processing conditions, composition, heat treatments, sintering aids and dopants, composite structure, grain size, and porosity. The technique is applicable to a wide range of materials including glasses, plastics, metals, ceramics, composites, crystals, and foams. The system can measure the same specimen prepared for the laser flash system as well as other geometryâs, including plates, cubes, bars, and irregular shapes. The thermal diffusivity of coatings can also be measured when the density, thickness, and specific heat of both the coating and the substrate are known.

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Diffraction & Thermophysical Prop. Group | <">High Temperature Materials Laboratory
Metals & Ceramics Division | Oak Ridge National Laboratory

Acknowledgments

URL: http://www.html.ornl.gov/tpuc/x-flash.html