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Philips XL30 FEG-SEM
This instrument can be downloaded and is provided here in Adobe PDF formats.
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Techniques/Capabilities:
- High current, 30kV FE gun
- SE/BSE imaging down to 0.2 and 2kV, respectively
- Si(Li) EDS X-ray detector (Z>3)
- EDS spectrum imaging
- Electron backscattered diffraction / orientation imaging microscopy
- Dry pumping system/ex-situ plasma cleaning of specimens
- Examination of radioactive materials
- Heating stage
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Current Research Activities:
- Structural characterization of high temperature alloys, composites, ceramics, nano-structured materials, carbon-based materials
- Elemental and phase distribution via EDS analysis/mapping and BSE imaging
- Phase distribution and microtexture determination via EBSD/OIM in advanced alloys, superconductors, mechanical and laser welds, deformed materials
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