Welcome to the Microscopy Group

JOEL 2200FS Aberration-Corrected TEM/STEM

The Microscopy Group at ORNL specializes in the development and application of advanced electron microscopy, atom probe tomography, and surface science techniques for the sub-nm scale characterization of the microstructure, chemical nature, and composition of materials. This world-class facility is comprised of a unique combination of state-of-the-art characterization instruments and staff members with expertise in materials science, microscopy, physics, and/or chemistry.

Access to the microscopy facilities, as well as to a staff member’s expertise, within the Microscopy Group is accomplished via submitting proposals to either of two DOE National User Centers supported within the group:

• the Shared Research Equipment (SHaRE) User Facility,
  which is one of three Electron Beam Microcharacterization
  Centers sponsored by the BES Scientific User Facilities
  Division
• the Materials Analysis User Center (MAUC), part of the High Temperature
  Materials Laboratory (HTML) User Facility, which focuses research
  activities on transportation materials.

The Advanced Microscopy Laboratory

Advanced analysis techniques available in the Microscopy Group include:

• aberration-corrected TEM/STEM with EELS, EFTEM, EDS,
  electron holography, HRTEM, HAADF
• high resolution and low voltage SEM with BSE, OIM, EDS,
  and variable pressure capabilities
• XPS and Auger Electron Spectroscopy for surface analysis
• 3D atom probe using LEAP
• extensive specimen preparation facilities, including FIB, PIPS, and microtomy

The principal technical contact for discussing potential projects in the Microscopy Group is Dr. Karren L. More, Leader; tel. (865) 574-7788, e-mail morekl1@ornl.gov.