Instrumentation and Capabilities

Transmission Electron Microscopy (TEM and STEM):

JEOL 2200FS - 200kV aberration-corrected TEM/STEM with EELS, EFTEM

• Available via HTML or SHaRE User Centers
• POC - Larry Allard

Hitachi HF-2000 FEG-TEM - 200kV cold field emitter, EDS, electron holography

• Available via HTML User Center
• POC - Jane Howe

Philips CM200 FEG-TEM/STEM - 200kV, Schottky emitter, EDS spectral imaging, EELS

• Available via SHaRE User Center
• POC - Jim Bentley

Philips CM30 TEM - 300kV LaB₆, EELS, EFTEM

• Available via SHaRE User Center
• POC - Jim Bentley

FEI Tecnai 20 TEM - 200kV LaB₆, conventional TEM, EDS

• Available via SHaRE User Center
• POC - Jim Bentley

FEI Titan 80-300 - 80-300kV, Schottky emitter, aberration-corrected TEM/STEM, EELS

• Currently part of developmental TEAM Project
• POC - Ed Kenik

Scanning Electron Microscopy:

Philips XL30 FEG SEM - SE and BSE imaging, EDS, EBSD/OIM

• Available via SHaRE User Center
• POC - Ed Kenik

Hitachi S3400 Variable Pressure SEM - EDS, SE and BSE imaging

• Available via HTML User Center
• POC - Larry Walker

JEOL 6500 FEG SEM - SE and BSE imaging, EDS, microcalorimeter EDS

• Available via SHaRE User Center
• POC - Ed Kenik

Electron Probe Microanalysis:

JEOL JXA-8200 FEG SEM - WDS and EDS

• Available via HTML User Center
• POC - Larry Walker

Atom Probe:

Imago Scientific Instruments Local Electrode Atom Probe (LEAP)

• Available via SHaRE User Center
• POC - Mike Miller

FEI Nova 200 Dual-Beam FIB

• Available via SHaRE User Center (support instrument only)
• POC - Mike Miller

Surface Science:

Physical Electronics PHI 680 Scanning Auger Nanoprobe

• Available via HTML User Center
• POC - Harry Meyer

Thermo Scientific K-Alpha XPS

• Available via HTML and SHaRE User Centers Centers
• POC - Harry Meyer

Specimen Preparation:

Leica UCT Ultramicrotome (RT and cryo) for TEM preparation

• Available by special request (full cost recovery)
• POC - K.S. Reeves

Hitachi FB-2000A FIB for TEM lift-out sample preparation

• Available via HTML User Center
• POC - Dorothy Coffey

SEM/TEM Specimen Preparation Labs

• Available via HTML User Center
• POC - Dorothy Coffey

Traditional ceramic and cross-section TEM preparation

• Available via HTML User Center
• POC - Dorothy Coffey

Traditional electropolishing for TEM preparation

• Available via SHaRE and HTML User Centers Centers
• POC - Kathy Thomas

Atom Probe needle preparation

• Available via SHaRE User Center
• POC - Kaye Russell

Metallography

• Available via HTML and SHaRE User Centers Centers (full cost recovery)