"Metastable phase evolution and grain growth in annealed nanocrystalline Cr-Fe-Ni films," E.D. Specht, P.D. Rack, A. Rar, G.M. Pharr, E.P. George, J.D. Fowlkes, H. Hong, and E. Karapetrov, Thin Solid Films, 493 (2005), pp. 307-312. "2D and 3D Percolation in High-Temperature Superconductors," E.D.Specht, A.Goyal, and D.M. Kroeger, Phys. Rev.B1, (1996), pp. 1-5. "Amorphization of Al,O, by Ion Induced Density Reduction," E.D. Specht, D.A. Walko, and S.J. Zinkle, Nucl. Instr. and Meth in Phys. Res, B 84 (1994), pp. 323-330. "Critical Current, Film Thickness and Grain Alignment for Spray-Pyrolyzed Films of T1Ba2CaaCu30", E.D. Specht, A. Goyal, D.M. Kroeger, A. Mogro-Campero, P.J. Bednarczyk, J.E. Tkaczyk, and J.A. DeLuca, Physica C 270 (1996), pp. 91-96. "Cube-textured Nickel Substrates for High Temperature Superconductors," E. D. Specht, A. Goyal, D. F. Lee, F. A. List, D. M. Kroeger, M. Paranthaman, R. K. Williams, and D. K. Christen, Supercond. Sci. Technol. 11 (1998), pp. 945–949. "Determination of Residual Stress in Cr-Implanted Al,03 by Glancing Angle X-ray Diffraction," E. D. Specht, C. J. Sparks, and C. J. McHargue, Appl. Phys. Lett., Vol. 80, No. 18, (1992), pp. 2216-2218. "Effect of Oxygen Pressure on the Orthoombic-tetragonal Transition in the High-Temperature Superconductor YBa2Cu3Ox," Specht, C. J. Sparks, A. G. Dhere, J. Brynestad, O. B. Cavin, and D. M. Kroeger, Phys. Rev. B, Vol. 37, No. 13, (1998), pp. 7426-7434. "In Situ Measurement of Growth Stress in Alumina Scale," E. D. Specht, and P. F. Tortorelli, and P. Zschack, Power Diffraction 19 (1), (2004), pp. 69-73. "Nonequilibrium Structures in Codeposited Cr-Fe-Ni Films," E.D. Specht, P.D. Rack, A. Rar, G.M. Pharr, E.P. George, and H. Hong. "Oxidation State of Buried Interface: Near-Edge X-ray Fine Structure of a Crystal Truncation Rod," E. D. Specht and F. J. Walker, Phys. Rev.B, Vol. 47, No. 20, (1993), pp. 743-751. "Phase Diagram and Phase Transitions of Krypton on Graphite in the One-to-two-Layer Regime," E. D. Specht, M. Sutton, and R. J. Birgeneau, Phys. Rev.B, Vol. 30, No. 3, (1984), pp. 1589-1592. "Rapid Structural and Chemical Characterization of Ternary Phase Diagrams Using Synchrotron Radiation", E.D. Specht, A. Rar, G.M. Pharr, and E.P George, P. Zschack and H. Hong, J. Ilavsky, J. Mater. Res., Vol. 18, No. 10, (2003), pp. 2522-2527. "Scaling of percolative current flow to long lengths in biaxially textured conductors," E. D. Specht, A. Goyal, and D.M. Kroeger, Supercond. Sci. Technol. 13 (2000) pp. 592–597. "Texture by the kilometer," E. D. Specht and F. A. List, pp. 1-6. "The Effect of Colonies of Aligned Grains on Critical Current in High-Temperature Superconductors," E. D. Specht., A. Goyal, D.M. Kroeger, J.A. DeLuca, J.E. Tkaczyk, C.L. Briant, J. A. Sutliff, Physica C 242 (1995) pp. 164-168. "Uniform Texture in Meter-Long YBa2Cu3O7 Tape," E. D. Specht, F. A. List, D. F. Lee, K. L. More, A. Goyal, W. B. Robbins, D. O'Neill, Physica C 382 (2002), pp. 342-348. "3D X-Ray Crystal Microscope," "Anomalous (Resonant) Diffuse X-ray Scattering Measurements of Local Correlations in Disordered Solid-Solution Alloys," G.E., Ice and C.J. Sparks, Accepted for Metal Physics and Advanced Technologies. "X-ray Microdiffraction Studies of Mesoscale Structure and Dynamics Below the Size of Most Polycrystalline Grains," G.E., Ice, J.-S. Chung, B.C. Larson, J. D. Budai, J.Z. Tischler and N. Tamura, Accepted for Metal Physics and Advanced Technologies. "Microbeam X-Ray Diffuse Scattering Study of Ion-Implantation Induced Defects in Silicon," B. C. Larson, M. Yoon, J. Z. Tischler, G. E. Ice, and T. E. Haynes, and P. Zschack, Accepted for Metal Physics and Advanced Technologies. "X-ray Microprobe for Fluorescence and Diffraction Analysis," Gene E. Ice, Methods in Materials Research: A Current Protocols Publication John Wiley and Sons New York (2000). "Small-Displacement Monochromator for Microdiffraction Experiments," Gene E. Ice and J.S. Chung, Rev. Sci. Inst. 71 2001-2006 (2000). "Microbeam-Forming Methods for Synchrotron Radiation," G.E. Ice, X-ray Spectrometry Vol. "Elliptical X-ray Microprobe Mirrors by Differential Deposition," Gene E. Ice, Jin-Seok Chung, and John Tischler, Andrew Lunt, Lahsen Assoufid, Rev. Sci. Inst. 71 2635 (2000). "Modern Resonant X-Ray Studies of Alloys: Local Order and Displacements," G.E. Ice and C.J. Sparks, Annu. Rev. Mater. Sci. 29 (1999) pp.25-52. "Automated Indexing for Texture and Strain Measurement with Broad-Bandpass X-ray Microbeams," Jin-Seok Chung and Gene E. Ice, Preprint: J. Appl. Phys. 86 5249 (1999). "Local Atomic Arrangements in Binary Solid Solutions Studied By X-Ray and Neutron Diffuse Scattering from Single Crystals," J. L. Robertson, C. J. Sparks, G. E. Ice, X. Jiang, S. C. Moss, L. Reinhard, Local Structure from Diffraction Materials Science Research Series eds. M.F. Thorpe and S. Billinge (Plenum Press) New York (1998).