SHaRE Instruments & Capabilities

Transmission and Scanning Transmission Electron Microscopes:

FEI Titan S TEM/STEM with CEOS Aberration-Corrector, EELS
Contact – Miaofang Chi, chim@ornl.gov

Philips CM200 FEG TEM/STEM with EDS, EELS
Contact – Jim Bentley, bentleyj@ornl.gov

FEI Tecnai 20 TEM with EDS
Contact – Jim Bentley, bentleyj@ornl.gov

Hitachi HF-3300 TEM/STEM with EDS
Contact - Jane Howe, howej@ornl.gov

Liquid STEM - In-Situ Microscopy
Contact - Niels de Jonge, dejongen@ornl.gov

Scanning Electron Microscopes:

Philips XL30 FEG-SEM with EDS and OIM
Contact – Ed Kenik, kenikea@ornl.gov

JEOL 6500 FEG-SEM with SDD-EDS
Contact – Ed Kenik, kenikea@ornl.gov

Hitachi NB-5000 Dual-Beam FIB with STEM, EDS, OIM
Contact – Ed Kenik, kenikea@ornl.gov

Atom Probe Facility:

Imago Scientific Instruments Local Electrode Atom Probe (LEAP®)
Contact – Mike Miller, (865) 574-4719

FEI Nova 200 Dual Beam FIB with EDS
Contact – Mike Miller, (865) 574-4719

X-Ray Photoelectron Spectrometry:

Thermo Scientific K-Alpha XPS
Contact – Harry Meyer, meyerhmiii@ornl.gov