SHaRE Instruments & Capabilities

Transmission Electron Microscopes:

JEOL 2200FS-AC TEM/STEM with CEOS Aberration-corrector, EELS
Contact – Karren L. More, morekl1@ornl.gov

Philips CM200 FEG TEM/STEM with EDS, EELS
Contact – Jim Bentley, bentleyj@ornl.gov

FEI Tecnai 20 TEM with EDS
Contact – Jim Bentley, bentleyj@ornl.gov

Philips CM30 TEM/STEM with GIF for EELS and EF-TEM
Contact – Jim Bentley, bentleyj@ornl.gov

Hitachi HF-3300 TEM/STEM
Contact - Jane Howe, howej@ornl.gov

Scanning Electron Microscopes:

Hitachi S4800 FEG-SEM with EDS
Contact – Ed Kenik, kenikea@ornl.gov

Hitachi S3400 Variable Pressure SEM with EDS
Contact – Larry Walker, walkerlr@ornl.gov

Philips XL30 FEG-SEM with EDS and OIM
Contact – Ed Kenik, kenikea@ornl.gov

JEOL 6500 FEG-SEM with mcalorimeter- and SDD-EDS
Contact – Ed Kenik, kenikea@ornl.gov

Atom Probe Facility:

Imago Scientific Local Electrode Atom Probe (LEAP)
Contact – Mike Miller, (865) 574-4719

FEI Nova 200 Dual Beam FIB with EDS
Contact – Mike Miller, (865) 574-4719

X-Ray Photoelectron Spectrometry:

Thermo Scientific K-Alpha XPS
Contact – Harry Meyer, meyerhmiii@ornl.gov